Page 40

EETE DEC 2014

Parametric measurement module doubles speed in SoC testing With the T2000 PMU32E, chip test system vendor Advantest extends the capabilities of its T2000 platform. The new high-density, 32-channel module offers twice the resolution and accuracy in testing digital, analog and power management systems-on-chips (SoC) devices. A T1200 tester equipped with the PMU32E can now achieve a similar accuracy, set-up time and gang functionality as a T2000 Enhanced Performance Package (EPP) tester. According to the vendor, measurement using the T2000 PMU32E is more than two times faster than with its predecessor. In particular, DC linearity measurement time is faster due to an enhanced sampling rate and enhanced data transfer. These faster operating speeds lead to significantly higher throughputs and a lower overall cost of test while maintaining backwards compatibility, Advantest says. Operating efficiency is further improved by the new module’s ability to run test programs already developed for the earlier PMU32 module. In addition, the new module has twice as much memory capacity, expanding the capabilities of the channel-independent arbitrary waveform generator (AWG) and digitizer. The PMU32E also supports load testing of on-die regulators (ODR) with its ISVM (current source and voltage measurement) ganging function. Advantest expects to begin shipping PMU32E modules to customers by the first quarter of 2015. Advantest www.advantest.de SystemDesk generates virtual ECUs for functional tests Version 4.3 of the Systemdesk Autosar tool from dSpace enables function developers and software integrators in the automotive domain to automatically generate virtual Electronic Control Units (V-ECUs) in a development process complying with Autosar R4. Within the dSpace tool chain for virtual safeguarding, VECUs facilitate testing of new ECU functions without the need for hardware prototypes. After integrating the new functions into the ECU application software, developers can use them to generate a V-ECU with just a few clicks. SystemDesk automatically generates and configures the necessary components such as the Autosar runtime environment and basis software components. If necessary, users can adapt the basis software configuration according to their needs. Thus, developers can create specific V-ECUs to test their functions; no specific previous knowledge as to the basis software is necessary. The benefits: For function tests, virtual ECUs are available earlier than the ECU hardware prototype, because the developer can generate it at its workplace PC. The functional behaviour of V-ECUs is comparable with the behaviour of physical ECUs. In addition, modifications or alterations can be implemented quickly and without much effort. dSpace www.dspace.de Single-channel gate driver provides on-chip galvanic isolation STMicroelectronics has launched the STGAP1S advanced single-channel gate driver which integrates galvanic isolation with analog and logic circuitry in the same chip to help simplify driver design while ensuring high noise immunity for safe and reliable power control. STGAP1S is the first in ST’s new generation of gapDRIVE gate drivers, which combine proprietary bipolar- CMOS-DMOS (BCD) process technology with innovations that enable an isolation layer to be grown on-chip to allow even greater system integration. Up to 1500V can be present on the high-voltage rail without interfering with other circuitry, ensuring a level of robustness that makes this new device ideal for use in industrial drives, high-power 600 V or 1200 V inverters, solar inverters, and uninterruptible power supplies. With signal-propagation delay of 100 ns across the isolation layer, the STGAP1S is capable of transmitting high-accuracy PWM signals. The integrated driver stage can sink or source up to 5 A, and has a rail-to-rail output that allows negative drive voltages for use with large IGBTs or wide-bandgap power switches, such as silicon-carbide MOSFETs. High common-mode transient immunity, in excess of ±50 V/ns, allows reliable communication across the isolation layer and safe operation. Separate sink and source outputs enhance design flexibility and help eliminate external components. The device also has a built-in SPI port for configuring the control logic and statuys monitoring. STMicroelectronics www.st.com Strain/force tag enables RFID weight monitoring The Atlas four-channel RFID-enabled force sensor tag from Farsens S.L. comes in two flavours: the Atlas Q100L with a strain measurement range of 0kfg to 45kgf and a maximum accuracy of ±0.5kgf per channel; and the Q2000L with a measurement range of 0 kgf to 900 kgf per channel and a maximum accuracy of ±10kgf per channel. Both tags transmit a unique identifier together with the associated weight measurement data from their four load cells, to any commercial EPC C1G2 reader without the need of a battery on the sensor tag. The tags come in a variety of antenna designs and sizes to adapt the performance to the required application in the 860-960 MHz band. The reading distance for the battery free strain/force tag is around 1.5 meters and it can be embedded in a wide variety of materials such as plastics or concrete. The tags are a perfect match for users that have RFID infrastructure in place and want to monitor weight without adding the cost of wiring or maintenance. They will find applications in warehouse inventory management, especially for granulates and liquids held into big containers or designed into smartpallets. Farsens S.L. www.farsens.com 40 Electronic Engineering Times Europe December 2014 www.electronics-eetimes.com


EETE DEC 2014
To see the actual publication please follow the link above