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TEST & MEASUREMENT only the wideband noise of the amplifier, not as a selectivity MIMO channel emulators with support for filter with a steep transition band. A steep transition band in the filter increases insertion loss and degrades the OIP3 of the multi-link networks and geometric modeling amplifier, which leads to distortion of the signal from the sensor. Azimuth Systems’ latest upgrade to its ACE MX and MX2 The circuit shown in figure 1 accomplishes this goal. MiMo channel emulators feature increased support for The ADC used is the LTC2195, a 16-bit 125Msps, simultane- multi-link and mesh networks, additional geometric modeling ous sampling, dual ADC operating from a single 1.8V supply. At capability, as well as an updated version of Director II test ex- 216mW per channel, this device achieves nearly identical sNr ecutive software (release 7.6) for enhanced functionality and performance as ADCs drawing 1.25W. ease-of-use. The aCe product line of fully-featured channel The LVDS serial interface allows the part to consume less emulators is designed to accurately recreate complex fading than half the board space of preceding ADCs and also al- channels for testing the most advanced wireless technology lows the use of smaller FPGAs due to the reduced number of and devices. I/O. Combined with the LTC6406, this circuit consumes only As purpose-built, enhanced testing solutions, ACE wireless 275mW – an obvious advantage for multichannel systems. This channel emulators are architected to meet the demanding circuit can be easily applied to the 14- or 12-bit members of the needs of Multiple-Input, Multiple-Output (MIMO) and orthog- family or to converters that sample at much lower sample rates, onal frequency-division multiplexing (OFDM)-based systems. further saving power. aCe channel emulators provide a superior platform for test- Figure 2 shows the performance of this circuit. The results ing LTE and other advanced wireless infrastructure equip- show that the linearity of the amplifier does not degrade the ment and devices, and also includes all of the backwards- SFDR of the ADC at low input frequencies. The SNR also compatible channel emulation features to test 2g/3g cellular remains unchanged at 76.5dB. The LTC6406 does not degrade products. Azimuth’s Director II Test Executive Software Suite the SNR or the SFDR of the LTC2195 when using it at unity lets users configure and manage test equipment as well as gain. devices, and initiate, control, and monitor network and test The trend toward “green” instruments and test equipment is bed traffic, while enabling the user to record, analyze, and inescapable, whether for fixed installations or portable equip- share performance results. ment. as performance levels increase and power consumption Azimuth Systems requirements decrease, it is important to match the components www.azimuthsystems.com of the entire signal chain. Programmable dual range DC power supplies RF radiation meter simplifies measurement for bench and ATE applications of emissions from industrial equipment B&K Precision’s 9170/9180 series of programmable dual The NIM series RF radiation meter from Link Microtek has range power supplies include nine models that provide been specifically designed to enable plant managers and clean and precise power up to 210W in various configura- safety professionals to take quick and easy measurements of tions of voltage as high as emissions from industrial sources such as 600V and current as high RF heat sealers, RF induction heaters and as 20A. Each model offers semiconductor fabrication equipment. two ranges of voltage and Manufactured by Narda safety Test solu- current output along with tions, the NIM unit provides a straightfor- modular interface slots for ward means of ensuring compliance with remote interface configu- the permissible exposure limits laid down rability. Delivered in rack-mountable, single and dual output in the iCNirp international standard. The model configurations, these DC power supplies are suitable battery-powered meter features an isotro- for challenging bench and ATE applications in design engi- pic, dual-element probe that simultane- neering labs and electronics manufacturing. Models in the ously measures electric and magnetic fields, both of which 9170/9180 series feature excellent line and load regulation are required for equipment operating below 300 MHz. Users less than 0.01% + 1mV, 0.01% + 250uA, ripple and noise can toggle between E-field and H-field readings at the press less than 0.35mVrms, a full numerical keypad with vertical of a button, and the instrument features automatic zeroing at and horizontal cursors for direct entry of voltage and current power-on and every 15 minutes. The meter is available in two values, front and rear panel output terminals, remote sense models: NiM-511 and NiM-513. The NiM-511 has a broad terminals, and a standard SCPI compliant USB interface for frequency range of 300 kHz to 100 MHz, making it suitable remote control. Unique to the 9170/9180 series is its modular for virtually all equipment operating at ISM (industrial, scien- interface design and special LED test modes. Users have tific and medical) frequencies. The NIM-513 operates over the option to choose from up to 4 different types of interface the narrower range of 10 to 42 MHz, encompassing the ISM cards, which include: LAN and GPIB, Digital I/O and Analog frequencies of 13.56 MHz and 27.12 MHz, which are widely Control, rs485, or rs232. These cards can be easily in- used for semiconductor processing equipment, heat seal- stalled at any time when needed into either of the two modu- ers and induction heaters. With an LED-backlit 1.5-inch LCD lar interface card slots on the power supply’s rear panel. LED display, the meter will operate for about 22 hours on a charge test modes can be used to minimize inrush current for safe of its NiMH batteries. it is supplied with a hard case, power testing of LEDs. supply and shoulder strap. B&K Precision Link Microtek bkprecision.com www.linkmicrotek.com 30 Electronic Engineering Times Europe January 2013 www.electronics-eetimes.com


EETE JANUARY 2013
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