Easy extensibility protects your investment Jitter measurements When characterizing serial interfaces such as USB 2.0, LVDS or HDMITM, it is essential to measure the jitter on clock and data signals. The R&S®RTO oscilloscopes enable high-precision jitter measurements thanks to their low-noise frontend, single-core A/D converters (ENOB > 7 bit), digital trigger system with extremely low trigger jitter, high-speed signal acquisition and fast analysis. The ¸RTO and ¸RTE oscilloscopes include eye diagram mask tests and histogram as standard analysis tools. The R&S®RTO-K12 option adds special jitter measurement parameters, a histogram track display and software based clock data recovery. The R&S®RTO-K13 option offers unique hardware-based clock data recovery that via a trigger can be linked to serial signal patterns of up to 128 bit. Power measurements Many special measurements are necessary when developing and integrating switched-mode power supplies and power electronics. Such measurements include analyzing the input and output parameters, the safe operating area for the power semiconductor, the modulation of the control loop and the switching frequency of the current and its harmonics. The R&S®RTx-K31 option for the R&S®RTM, R&S®RTE and R&S®RTO oscilloscopes makes it easy to implement these specific measurements and document the results. A wide range of passive high-voltage probes, active differential probes, current probes and a deskew fixture are available for use with the oscilloscopes. Protocol analysis Serial bus systems are integrated into a variety of electronic circuits. In order to verify the overall functioning of the circuit, both the physical layer and the protocol layer must be tested. All Rohde & Schwarz oscilloscopes offer trigger and decode options for the most frequently used protocols, including I2C, SPI and UART/RS-232. The R&S®RTO offers 13 different protocols. All of the options provide hardware-based triggering for rapidly isolating specific data messages or protocol errors and clearly display the decoded messages in table format. Frequency analysis and EMI debugging Ever higher clock and data rates and the use of switched-mode power supplies increase the occurrence of EMI in and around a circuit. A reliable, fast and easy method for analyzing the frequency range is therefore essential. Decades of frequency domain experience have gone into the FFT analysis function featured in the ¸RTM, R&S®RTE and R&S®RTO oscilloscopes. The user interface corresponds to that of a spectrum analyzer. The hardware-based FFT implementation combined with the low-noise frontends ensures unrivaled sensitivity and processing speed.
EETE JUN 2015
To see the actual publication please follow the link above