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EETE MAR 2015

Serial EEPROM Serial EEPROM Bus Comparison Parameter I2C™ Microwire UNI/O® Bus SPI Density Range 128 bits–1 Mbit 1 Kbit–16 Kbits 1 Kbit–16 Kbits 1 Kbit–1 Mbit Speed Up to 1 MHz Up to 3 MHz Up to 100 kHz Up to 20 MHz I/O Pins 2: Clock, Data 4: Clock, CS, DI, DO 1: Clock/Data 4: SCK, CS, DI, DO Package Options 2005 2006 2007 2008 2009 2010 2011 2012 2013 1.0 0.8 0.6 0.4 0.2 0 500,000 1,000,000 1,500,000 2,000,000 150 120 90 60 30 0 Supplier A Supplier B Supplier C Supplier D Microchip 4 Memory Products PDIP, SOIC, SOIJ, TSSOP, MSOP, 2 × 3 TDFN, 6 × 5 DFN, SOT-23, SC70, WLCSP PDIP, SOIC, TSSOP, MSOP, 2 × 3 TDFN, SOT-23 PDIP, SOIC, TSSOP, MSOP, 2 × 3 TDFN, SOT-23, TO92, WLCSP PDIP, SOIC, SOIJ, TSSOP, MSOP, 2 × 3 TDFN, 6 × 5 DFN, SOT-23 Security Options Hardware Hardware Software Hardware/Software Pricing Fewest features/lowest cost –––––––––––––––––––––––––––––––––––––––— Most features/highest cost Microchip’s best-in-class field performance is the combined result of Wafer Level Burn-In and Wafer Probe-Quality Screens. Microchip Serial EEPROM Field Return Data ■ Industry’s lowest field return numbers, best suited for automotive applications Microchip Serial EEPROM Endurance E/W Cycles at 85C ■ All devices from supplier A and B failed before 2 million E/W cycles at 85°C ■ Testing shows zero Microchip EEPROM fails even at 2 million E/W cycles at 85°C Standard and Specialty/Application-Specific EEPROMs Serial EEPROMs Standard EEPROMs I2C™ 128b–1 Mb, 1.7–5.5V UNI/O® Bus 1–16 Kb, 1.8–5.5V Specialty/Application Specific EEPROMs MAC Address Chips EUI-48™ & EUI-64™ Node Address Microwire 1–16 Kb, 1.8–5.5V SPI 1 Kb–1 Mb, 1.8–5.5V Partial Array Write Protect ½, ¼ and Whole Array WP Options DIMM-DDR2/3/4 Reversible Software Write Protect; I2C Extended Temperature −55 to 150°C VESA Monitors DDC1™/DDC2™ Interface Very-Low Voltage 1.5V EEPROM Unique ID Total Endurance™ Software Model Total Endurance Software Model provides a comprehensive model that helps estimate the endurance and reliability of Microchip Serial EEPROM devices. By providing operating conditions based on your application, all design tradeoffs affecting reliability can be accurately estimated both graphically and numerically in PPM, FIT and MTBF modes, saving time and ensuring a truly robust design. The Total Endurance Software Model is available for free online at www.microchip.com/EEPROM.


EETE MAR 2015
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