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A8E_EE-Times-Eur_2-375x10-875_A8.qxd 8/26/15 4: Surface Mount Transformers (and Plug In) and Inductors Catalog immediately Pico’s full coelectroni cs.c om See w w w.pi Low Profile from 4,5mm ht. the Pickering Interfaces family of switching systems only. At this time, there are no plans to broaden this scope. Q: How can eBIRST tools be made traceable and checked? A: Functionality and accuracy of the eBIRST tools can be checked with the aid of an external calibration fixture that allows users to either connect two tools together or measure a set of fixed value precision resistors. The two tools are controlled to perform Audio Transformers Impedance Levels 10 ohms to 250k ohms, Power Levels to 3 Watts, Frequency Response ±3db 20Hz to 250Hz. All units manufactured and tested to MIL-PRF-27. QPL Units available. Power & EMI Inductors Ideal for Noise, Spike and Power Filtering Applications in Power Supplies, DC-DC Converters and Switching Regulators Pulse Transformers 10 Nanoseconds to 100 Microseconds. ET Rating to 150 Volt Microsecond, Manufactured and tested to MIL-PRF-21038. Multiplex Data Bus Pulse Transformers Plug-In units meet the requirements of QPL-MIL-PRF 21038/27. Surface units are electrical equivalents of QPL-MIL-PRF 21038/27. DC-DC Converter Transformers Input voltages of 5V, 12V, 24V And 48V. Standard Output Voltages to 300V (Special voltages can be supplied). Can be used as self saturating or linear switching applications. All units manufactured and tested to MIL-PRF-27. 400Hz/800Hz Power Transformers 0.4 Watts to 150 Watts. Secondary Voltages 5V to 300V. Units manufactured to MIL-PRF-27 Grade 5, Class S (Class V, 1550C available). Delivery-Stock to one week for sample quantities PICO Electronics, Inc. 143 Sparks Ave. Pelham, N.Y. 10803 E Mail: info@picoelectronics.com www.picoelectronics.com Pico Representatives Germany ELBV/Electronische Bauelemente Vertrieb E mail: info@elbv.de Phone: 0049 (0)89 4602852 Fax: 0049 (0)89 46205442 England Ginsbury Electronics Ltd. E-mail: rbennett@ginsbury.co.uk Phone: 0044 1634 298900 Fax: 0044 1634 290904 a cross-check of their functional performance and the precision resistors on the fixture allow the tool to check for measurement accuracy. The resistors in the fixture can be checked using a user supplied calibrated DMM to ensure traceability. Q: What steps are necessary to run a test? A: Connect the eBIRST tool to the switching system, via an adapter if required. The switching system can be PXI, PCI or LXI based; it makes no difference as long as it uses a connector supported by the eBIRST tools. Then simply run the supplied application program Q: Does the user need to configure the tool for a different switching system to be tested? A: For each switching system to be tested there is a Test Definition File that describes the tests to be performed and the limits to be applied. If the required Test Definition File is not present, a newer version of the eBIRST application program needs to be installed. Pickering Interfaces will continually expand the availability of Test Definition Files to cover all supported switching systems. Q: How do I find out where faulty relays are physically located? A: The eBIRST tools will quickly test the switching system, locate the faulty relay(s) and inform you what relays to replace via a graphical output. This output identifies the relays that need attention and where physically they are on the switching system. There is no need to refer to manuals to use lengthy cross reference tables that convert a functional position (e.g. X-Y co-ordinates on a matrix) to relays designation (e.g. RL123), then try to find it on the PCB layout. Instead, the eBIRST tools show you a layout of the PCB and exactly where the defective relays are on that layout. The eBIRST tools make fault location easy in order to simplify the repair task. Q: What if my switching system doesn’t look to be supported by eBIRST? A: Contact Pickering to request it – If there are no technical reasons why we can’t support the system (a minority of our switching systems cannot be supported for various technical reasons), we will add a Test Definition File to the application program. www.electronics-eetimes.com Electronic Engineering Times Europe October 2015 39


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