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Test & Measurement is less accurate and only works internally. For example, it does not test for connector issues. The eBIRST tools, however, will test most of the other switching in your system. Finally, one set of eBIRST tools can support an entire test floor, keeping your support costs low. I would recommend any test department manager to review their test system support strategy and to consider using Pickering Interfaces switching and eBIRST as part of their plan to maximize test system uptime. So – the main question should be: Why choose Pickering products supported by the eBIRST switching system tools? Users buy switching systems to test products. When the switching system develops a fault, it causes downtime, consumes an engineer’s time to diagnose the fault and delays projects. So when problems occur—instead of figuring out how to identify and rectify the fault, get your eBIRST tool, connect it to the system and run the test. The eBIRST tools will quickly test the switching system, locate the faulty relay and inform you what relays to replace. Downtime is considerably reduced, and the problems of misdiagnosed faults causing ineffective repairs to be carried out are minimized. So along with Pickering’s diagnostic test tools, standard three-year warranty and long-term product support, no other switching system manufacturer offers this level of support for their products. Pickering and eBIRST should be considered as part of your test system support strategy. High flex PIM test lead optimised up to 4GHz Huber+Suhner has designed a PIM test lead for use with factory PIM analysers where there is a requirement to test antennas and components, as well as in the field with portable PIM analysers. The PIM test lead features a highly flexible, rugged and reliable construction and the company has designed the TL-P to be very durable with more than 2000 mating cycles achievable under normal working conditions. Optimised up to 4GHz, the TL-P PIM test lead is equally suitable for Return/Loss (RL) testing. Available in cable lengths of 1.5 or 3m, key values include a PIM figure greater than -117dBm (tested to IEC62037-2), return loss (up to L = 3m) of under 20dB at 4GHz and attenuation up to 0.90dB/m at 3GHz. The TL-P can handle power levels to 560W at 1GHz and has a shielding effectiveness greater than -120dB. All test lead assemblies are 100% tested for PIM, return loss and attenuation and come with a PIM test report and connector protection caps. Huber+Suhner www.hubersuhner.co.uk Q: What happens after a repair is carried out? A: After carrying out repairs as required, reconnect the test tool and run the application program again to check that repairs were successful. Ideally try to find why the failure occurred (relay failures usually have an external cause). Then re-deploy the switching system. Provided repairs have been done correctly, our policy is that there is no impact on the 3-year warranty offered by Pickering Interfaces. Q: Pickering has had the BIRST (Built-In Relay Self-Test) feature on its high-value matrices for years. So why use eBIRST tools and why are they better? A: BIRST is a tool internal to our matrix switching modules. While it can test relay paths in the matrix and report errors, it Near-field probe pinpoints RF sources from 1 to 10GHz The SX probe heads’ high measurement resolution allows the developer to pinpoint RF sources of between 1 GHz and 10 GHz on densely packed printed circuit boards or on IC pins. The handy compact pin shape of the EMC near-field probes provides the developer with convenient working conditions on the respective PCB. High clock rates of 2 GHz, for example, may result in 5th order harmonics of up to 10 GHz. These harmonics are coupled out by RF sources on the PCB such as conductor sections, ICs and other components. They may stimulate other structural parts of the PCB to vibrate and generate emissions. In view of the high internal fundamental frequency of current PCBs, the measurement of harmonics of this frequency is an important step towards reliable EMC. The new SX1 near-field probe set contains three near-field probes with high resolution for measurements in the upper frequency range. The SX-E 03 is an E-field probe for frequencies between 1 GHz and 10 GHz with an electrode on the underside of the probe head sized approx. 4x4mm. This probe can be used to pinpoint small E-field sources such as conductors, individual components on a printed circuit board, etc. The head of the near-field probe is usually placed directly on the object of the measurement (high electric field strength). The SX-R 3-1 is an H-field probe for frequencies between 1 GHz and 10 GHz with a very small probe head to identify even the smallest components as a source of interference. This small probe head is also ideal for carrying out measurements in hard-to-reach locations such as in the vicinity of IC pins. Langer EMV-Technik GmbH www.langer-emv.de 40 Electronic Engineering Times Europe October 2015 www.electronics-eetimes.com


EETE OCT 2015
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