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EETE SEPT 2013

TEST & MEASUREMENT Signal analysers gain improved phase-noise performance, sweep speed Agilent Technologies has announced greater core performance in two of its X-Series signal analysers, the midrange MXA and general purpose EXA. The respective improvements in phase noise allow you to more precisely characterise the frequency stability of oscillators and synthesisers. The faster sweep speeds of these analysers accelerate searches for spurious signals in the testing of transmitters, active antenna arrays and power amplifiers. Phase-noise performance is a key factor in obtaining low and accurate error vector magnitude values for communication systems and devices. In the MXA, phase noise has been improved by 10 dB or more for close-in and pedestal offset frequencies, providing a best-in-class advantage of 7 dB over the closest comparable competitor. EXA phase-noise performance is up to 5 dB better across wide offset frequencies. The new “fast sweep” capability of these analysers is up to five times faster than that of competitive models, depending on resolution bandwidth. Faster sweeps improve measurement throughput and make it easier to check the spurious-free dynamic range of devices under test. The N9069A noise figure measurement application now includes advanced features that support measurements of multistage converters, multipliers and dividers. The N9080A (FDD) and N9082A (TDD) LTE measurement applications now support multimedia broadcast single-frequency network (MBSFN) signals with mixed cyclic-prefix subframe structures. Agilent Technologies www.agilent.com Scopes offer mixed-signal probing to 33 GHz Tektronix has added to to its flagship mixed-signal Oscilloscope family; the MSO/DPO70000DX series enhances mixed signal performance and probing capability to 33GHz, and offers upgrade paths as users’ needs change MSO/ DPO70000DX oscilloscopes feature models with 23 GHz, 25 GHz, and 33 GHz bandwidth and enhanced tools for debugging digital and analogue circuits. Tek has also announced the fastest and lowest noise Oscilloscope probe with 33 GHz bandwidth and highest sensitivity for lowvoltage, High-Speed serial and RF signals. MSO70000DX mixed signal oscilloscopes span 70MHz up to 33GHz in analogue bandwidth. With 16 digital channels provided on all Tektronix MSO’s, the instruments provide an 80 psec digital timing resolution. This enables engineers to get accurate feedback on logic or protocol performance for serial buses such as USB, I2C, and SPI in real-time while performing analogue validation of high speed DDR memory on the four highbandwidth channels. With the addition of the 33GHz P7600 series TriMode probe Tektronix claims the highest bandwidth probing system on the market. The TriMode probing system gives engineers a single probe setup for differential, single ended and common mode measurements for more value from each scope channel. Tektronix www.tek.com Digital radio test set with a very low phase noise Aeroflex’ 3920B digital radio test set is aimed at analogue AM and FM, digital P25, P25 Phase II, DMR, NXDN, dPMR, TETRA and TEDS technologies. The 3920B features a new low phase noise RF signal generator in addition to the already advanced functionality available on the Aeroflex 3900 Series Radio Test Sets. The unit is the direct replacement for all versions of the Aeroflex 3900 Series, including the 3901, the 3902, and the 3920. It features a new low phase noise RF signal generator providing enhanced spectral purity with SSB phase noise specified at -110 dBc/ Hz at 10 kHz offset. This level of performance is achieved at an offset from the carrier that is significantly less than the industry standard for this type of specification, which is typically 20 kHz. The ability of the 3920B to achieve such low phase noise specifications close to the carrier makes the 3920B suitable for today’s digital narrowband or analogue receiver testing where narrowband phase noise is critical. Aeroflex www.aeroflex.com New 100A, 3-phase burst pulse tester targets networks using renewable energy Swiss EMC test equipment maker Teseq has launched 100A, 3-phase burst pulse coupling/decoupling network (CDN) designed for electrical fast transient (EFT) or burst testing in the power and telecom industries. The manual CDN 3083-B100 can easily carry out applications that require higher AC and DC voltages as well as high inrush or pulse-shaped peak currents like those found in renewable energy. Some applications include smart grid, inverters, solar, energy monitoring as well as applications for electric vehicles and charging stations. The CDN 3083- B100 can couple up to 8.8 kV (5/50 ns – 50 Ohms) EFT pulses simultaneously into the supply lines of the equipment under test (EUT). It is designed to be used with an EUT supply up to 690 VAC, either line-to-line or line to protective earth, or up to 1,000 VDC line-to-line or line to protective earth. The compact, lightweight CDN is compliant to IEC 61000-4-4-Ed. 3.0, compatible with all brands of burst generators and is extremely portable for field testing. It allows for more set-up options in standard compliance applications because it is external to the generator and is compact. Although it is designed for continuous performance up to 100 A per phase, the CDN 3083-B100 can withstand higher currents for shorter durations of time. The CDN also features built-in temperature monitoring to prevent damage to its internal components and avoid overload. Teseq’s CDN 3083-B100 includes screw terminals rated for 200 A, a SHV burst input connector with maximum burst voltage of 8.8 kV and earth terminal grounding. Weighing approximately 5 kg, the CDN measures 410x170x190mm. Teseq www.teseq.com 38 Electronic Engineering Times Europe September 2013 www.electronics-eetimes.com


EETE SEPT 2013
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